Researcher profile

Jiansheng Yao

Jiansheng Yao contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2022arXiv

Electron Beam Weibel Instability in the Collisionless Shock with Low Mach Number

The electron beam Weibel instability in the electrostatic collisionless shock is studied via particle in cell simulation. When the non-relativistic incoming plasmas collide with cold dilute plasmas, an electrostatic shock forms near the interface. Following that, a filamentary out-of-plane magnetic field is formed as a result of the Weibel instability. It is demonstrated that the anisotropy of incoming hot electrons is insufficient to trigger the Weibel instability. And the Weibel instability is excited by cold electrons in dilute plasmas. After being accelerated to relativistic velocities by the shock electric field into the dense plasmas, electrons in the dilute plasma have considerable anisotropy and can trigger the Weibel instability

preprint2021arXiv

Study of similarity rules for electromagnetic process in partially ionized plasmas

As proved by previous study, the similarity of electromagnetic processes in plasmas will be violated by Coulomb collisions between electron and ions. Therefore, there is no similarity in highly ionized collisional plasma. But the situation will be completely different for collisional plasmas with low ionization degree. The main collision type will change from electron-ion Coulomb collision to electron-molecule collision, and a new variable (the number density of neutral molecules) will be introduced into the similarity constraint, which can increase the degree of freedom.Thus, in this condition, the similarity restriction caused by the collision process does not conflict with the other restrictions. Therefore, the similarity for electromagnetic process in collisional plasmas can be valid for partially ionized plasmas. In this paper, we propose the similarity in partially ionized plasmas, and prove it via particle in cell/Monte Carlo (PIC/MCC) simulation. Our research has a wide range of engineering applications.