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Jerome Wolfman

Jerome Wolfman appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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cond-mat.mtrl-sci

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Published work

3 published item(s)

preprint2010arXiv

Electrode effects on electrical properties of polycrystalline (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 thin films

(Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 thin films were grown on IrO2 and Pt coated Si substrates. Film on Pt electrode showed large dielectric dispersion at lower frequency and on other hand film on IrO2 showed dielectric constant almost independent with frequency up to 1 MHz. Tunability (Loss) on Pt and IrO2 at 1 MHz were 55% (0.159) and 45% (0.07), respectively. The FOM is also high for film on IrO2 (620) compared on to the Pt (345). Very low leakage current density also obtained on IrO2 (1.3 x 10-6 A/cm2) compared to Pt (6.14x10-3 A/cm2) coated Si substrates.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Frequency dependent negative capacitance of (Ba0.6Sr0.4)(ZrxTi1-x)O3 thin films grown on La0.9Sr1.1NiO4 buffered SrTiO3 substrate

Ba0.6Sr0.4TiO3 and (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 thin films were deposited on La0.9Sr1.1NiO4 buffered SrTiO3 substrates. (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 film (2.77 nF) showed one order large capacitance compared to that of Ba0.6Sr0.4TiO3 film (270 pF) at 100 kHz. (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 film showed negative capacitance at f >3 MHz except for f=5.05 to 7.36 MHz, and 10.4 to 13.4 MHz, where it showed positive capacitance. Tunability of the Ba0.6Sr0.4TiO3 film (~15%) is much lower than that of the (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 film (30 to 65%, both normal and inverse). A significant change of the tunability was observed at frequencies f>500 kHz for the (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 film showing inverse tunability, this can be attributed to the negative capacitance effect, where current lags behind the voltage. (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 film (6.87x10-6 A/cm2) showing one order high leakage current density than BST film (1.32x10-7 A/cm2). Ba0.6Sr0.4TiO3 film showed large grain size (140 nm) and surface roughness (11.5 nm) and (Ba0.6Sr0.4)(Zr0.3Ti0.7)O3 film showed small grain size (80 nm) and roughness (2.3 nm).

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

Microstructural and dielectric properties of Ba0.6Sr0.4Ti1-xZrxO3 based combinatorial thin film capacitors library

Epitaxial growth of Ba0.6Sr0.4Ti1-xZrxO3 (0/leqx\leq0.3) composition spread thin film library on SrRuO3/SrTiO3 layer by combinatorial pulsed laser deposition (PLD) is reported. X-ray diffraction and energy dispersive x-ray spectroscopy studies showed an accurate control of the film phase and composition by combinatorial PLD. A complex evolution of the microstructure and morphology with composition of the library is described, resulting from the interplay between epitaxial stress, increased chemical pressure and reduced elastic energy upon Zr doping. Statistical and temperature-related capacitive measurements across the library showed unexpected variations of the dielectric properties. Doping windows with enhanced permittivity and tunability are identified, and correlated to microstructural properties.

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