Researcher profile

Jan Krieft

Jan Krieft contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2021arXiv

Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD

X-ray resonant magnetic reflectivity (XRMR) allows for the simultaneous measurement of structural, optical and magnetooptic properties and depth profiles of a variety of thin film samples. However, a same-beamtime same-sample systematic quantitative comparison of the magnetic properties observed with XRMR and x-ray magnetic circular dichroism (XMCD) is still pending. Here, the XRMR results (Pt L$_{3}$ absorption edge) for the magnetic proximity effect in Pt deposited on the two different ferromagnetic materials Fe and Co$_{33}$Fe$_{67}$ are compared with quantitatively analyzed XMCD results. The obtained results are in very good quantitative agreement between the absorption-based (XMCD) and reflectivity-based (XRMR) techniques taking into account an ab initio calculated magnetooptic conversion factor for the XRMR analysis. Thus, it is shown that XRMR provides quantitative reliable spin depth profiles important for spintronic and spin caloritronic transport phenomena at this type of magnetic interfaces.

preprint2020arXiv

Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity

X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin films. Here, we investigate samples of different complexity all measured at the Pt L$_3$ absorption edge to determine the optimal procedure for the analysis of the experimental XRMR curves, especially for nontrivial bi- and multilayer samples that include differently bonded Pt from layer to layer. The software tool ReMagX is used to fit these data and model the magnetooptic depth profiles based on a highly adaptable layer stack which is modified to be a more precise and physically consistent representation of the real multilayer system. Various fitting algorithms, iterative optimization approaches and a detailed analysis of the asymmetry ratio features as well as $χ^2$ (goodness of fit) landscapes are utilized to improve the agreement between measurements and simulations. We present a step-by-step analysis procedure tailored to the Pt thin film systems to take advantage of the excellent magnetic sensitivity and depth resolution of XRMR.

preprint2020arXiv

Impact of the magnetic proximity effect in Pt on the total magnetic moment of Pt/Co/Ta trilayers studied by x-ray resonant magnetic reflectivity

In this work, we study the influence of the magnetic proximity effect (MPE) in Pt on the total magnetic moment of thin film trilayer systems consisting of the ferromagnet (FM) Co adjacent to the heavy metals (HMs) Pt and Ta. We investigate the trilayer systems HM1/FM/HM2 with different stacking order as well as a reference bilayer without any MPE. X-ray resonant magnetic reflectivity (XRMR) is a powerful tool to probe induced magnetism, especially when buried at interfaces in a multilayer. By using XRMR, we are able to obtain magnetic depth profiles of the structural, optical and magnetic parameters. By fitting the experimental data with a Gaussian-like magnetooptic profile taking the structural roughness at the interface into account, we can extract the magnetic moment of the spin-polarized layer. Comparing the obtained moments to the measured total moment of the sample, we can determine the impact of the MPE on the total magnetic moment of the system. Such information can be critical for analyzing spin transport experiments, including spin-orbit torque and spin Hall angle measurements, where the saturation magnetization $M_s$ has to be taken into account. Therefore, by combining magnetization measurements and XRMR methods we were able to get a complete picture of the magnetic moment distribution in these trilayer systems containing spin-polarized Pt.