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James Welsh

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2 published item(s)

preprint2015arXiv

Identification of Stochastic Wiener Systems using Indirect Inference

We study identification of stochastic Wiener dynamic systems using so-called indirect inference. The main idea is to first fit an auxiliary model to the observed data and then in a second step, often by simulation, fit a more structured model to the estimated auxiliary model. This two-step procedure can be used when the direct maximum-likelihood estimate is difficult or intractable to compute. One such example is the identification of stochastic Wiener systems, i.e.,~linear dynamic systems with process noise where the output is measured using a non-linear sensor with additive measurement noise. It is in principle possible to evaluate the log-likelihood cost function using numerical integration, but the corresponding optimization problem can be quite intricate. This motivates studying consistent, but sub-optimal, identification methods for stochastic Wiener systems. We will consider indirect inference using the best linear approximation as an auxiliary model. We show that the key to obtain a reliable estimate is to use uncertainty weighting when fitting the stochastic Wiener model to the auxiliary model estimate. The main technical contribution of this paper is the corresponding asymptotic variance analysis. A numerical evaluation is presented based on a first-order finite impulse response system with a cubic non-linearity, for which certain illustrative analytic properties are derived.

preprint2014arXiv

High-level numerical simulations of noise in CCD and CMOS photosensors: review and tutorial

In many applications, such as development and testing of image processing algorithms, it is often necessary to simulate images containing realistic noise from solid-state photosensors. A high-level model of CCD and CMOS photosensors based on a literature review is formulated in this paper. The model includes photo-response non-uniformity, photon shot noise, dark current Fixed Pattern Noise, dark current shot noise, offset Fixed Pattern Noise, source follower noise, sense node reset noise, and quantisation noise. The model also includes voltage-to-voltage, voltage-to-electrons, and analogue-to-digital converter non-linearities. The formulated model can be used to create synthetic images for testing and validation of image processing algorithms in the presence of realistic images noise. An example of the simulated CMOS photosensor and a comparison with a custom-made CMOS hardware sensor is presented. Procedures for characterisation from both light and dark noises are described. Experimental results that confirm the validity of the numerical model are provided. The paper addresses the issue of the lack of comprehensive high-level photosensor models that enable engineers to simulate realistic effects of noise on the images obtained from solid-state photosensors.