Entropy Density Benchmarking of Near-Term Quantum Circuits
Understanding the limitations imposed by noise on current and next-generation quantum devices is a crucial step towards demonstrating practical quantum advantage. In this work, we investigate the accumulation of entropy density as a benchmark to monitor the performance of quantum processing units. We provide a proof-of-principle demonstration of our novel methodology which entails developing simple heuristic models of how entropy accumulates, testing them against real QPU experiments, and finally using these models to determine a circuit volume threshold above which quantum advantage is unattainable. Monitoring entropy density not only offers a novel approach that complements existing circuit-level benchmarking techniques, but more importantly, it bridges the gap between circuit-level and application-level benchmarking protocols. In particular, our heuristic model of entropy accumulation allows us to outperform existing techniques that bound the circuit size threshold for quantum advantage.