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Researcher profile

J. Maxson

J. Maxson contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
physics.acc-ph

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Published work

2 published item(s)

preprint2016arXiv

Demonstration of single-shot picosecond time-resolved MeV electron imaging using a compact permanent magnet quadrupole based lens

We present the results of an experiment where a short focal length (~ 1.3 cm) permanent magnet electron lens is used to image micron-size features of a metal sample in a single shot, using an ultra- high brightness ps-long 4 MeV electron beam from a radiofrequency photoinjector. Magnifcation ratios in excess of 30x were obtained using a triplet of compact, small gap (3.5 mm), Halbach-style permanent magnet quadrupoles with nearly 600 T/m field gradients. These results pave the way to- wards single shot time-resolved electron microscopy and open new opportunities in the applications of high brightness electron beams.

0 citations0 reviewsNo code linkedOpen access
preprint2016arXiv

Multi-objective Optimizations of a Normal Conducting RF Gun Based Ultra Fast Electron Diffraction Beamline

We present the results of multi-objective genetic algorithm optimizations of a potential single shot ultra fast electron diffraction beamline utilizing a 100 MV/m 1.6 cell normal conducting rf (NCRF) gun, as well as a 9 cell 2pi/3 bunching cavity placed between two solenoids. Optimizations of the transverse projected emittance as a function of bunch charge are presented and discussed in terms of the scaling laws derived in the charge saturation limit. Additionally, optimization of the transverse coherence length as a function of final rms bunch length at the sample location have been performed for a charge of 1e6 electrons. Analysis of the solutions is discussed, as are the effects of disorder induced heating. In particular, for a charge of $10^6$ electrons and final beam size greater than or equal to 25 microns, we found a relative coherence length of 0.07, 0.1, and 0.2 nm/micron for a final bunch length of approximately 5, 30, and 100 fs, respectively. These results demonstrate the viability of using genetic algorithms in the design and operation of ultrafast electron diffraction beamlines.

0 citations0 reviewsNo code linkedOpen access