Source author record

J. Henry Hinnefeld

J. Henry Hinnefeld appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
2topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2016arXiv

Single Gate P-N Junctions in Graphene-Ferroelectric Devices

Graphene's linear dispersion relation and the attendant implications for bipolar electronics applications have motivated a range of experimental efforts aimed at producing p-n junctions in graphene. Here we report electrical transport measurements of graphene p-n junctions formed via simple modifications to a PbZr$_{0.2}$Ti$_{0.8}$O$_3$ substrate, combined with a self-assembled layer of ambient environmental dopants. We show that the substrate configuration controls the local doping region, and that the p-n junction behavior can be controlled with a single gate. Finally, we show that the ferroelectric substrate induces a hysteresis in the environmental doping which can be utilized to activate and deactivate the doping, yielding an `on-demand' p-n junction in graphene controlled by a single, universal backgate.

preprint2014arXiv

Reversible mechanical and electrical properties of ripped graphene

We examine the mechanical properties of graphene devices stretched on flexible elastomer substrates. Using atomic force microscopy, transport measurements, and mechanics simulations, we show that micro-rips form in the graphene during the initial application of tensile strain; however subsequent applications of the same tensile strain elastically open and close the existing rips. Correspondingly, while the initial tensile strain degrades the devices' transport properties, subsequent strain-relaxation cycles affect transport only moderately, and in a largely reversible fashion, yielding robust electrical transport even after partial mechanical failure.