Source author record

J. Dubowik

J. Dubowik appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
2topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2014arXiv

Coplanar waveguide based ferromagnetic resonance in ultrathin film magnetic nanostructures: impact of conducting layers

We report broadband ferromagnetic resonance (FMR) measurements based on a coplanar waveguide (CPW) of ultrathin magnetic film structures that comprise in-plane/out-of-plane decoupled layers deposited on nonmagnetic buffer layers of various thickness or other buffer structures with a diverse sheet resistance. We show that the excitation of the fundamental mode can be substantially (up to 10 times) enhanced in the structures deposited on buffer layers with a low sheet resistance in comparison to the structures deposited on thin or weakly conducting buffer layers. The results are analyzed in terms of shielding of the electromagnetic field of CPW by the conducting buffer layers. The effect of enhancement of FMR absorption can be attractive for applications in spintronic devices that utilize magnetization dynamics of ultrathin ferromagnetic layers.

preprint2014arXiv

Micromagnetic approach to exchange bias---A new look at an old problem

We present a micromagnetic approach to exchange bias (EB) in ferromagnetic (FM)/antiferromagnetic (AFM) thin film systems with a small number of irreversible interfacial magnetic moments. We express the exchange bias field $H_{EB}$ in terms of fundamental micromagnetic length scale---the exchange length $l_{ex}$. The benefit from this approach is a better separation of a term related to FM layer from a term related to FM/AFM coupling at interfaces. Using this approach we estimate the highest limit of $H_{EB}$ in real FM/AFM systems.