Researcher profile

I. K. Robinson

I. K. Robinson contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2019arXiv

Scaling Behaviour of Low-Temperature Orthorhombic Domains in Prototypical High-Temperature Superconductor La$_{1.875}$Ba$_{0.125}$CuO$_{4}$

Translational/rotational symmetry breaking and recovery in condensed matter systems are closely related to exotic physical properties such as superconductivity (SC), magnetism, spin density waves (SDW) and charge density waves (CDW). The interplay between different order parameters is intricate and often subject to intense debate, as in the case of CDW order and superconductivity. In La1:875Ba0:125CuO4 (LBCO), the locations of CDW domains are found to be pinned on the nanometer size scale. Coherent X-ray diffraction techniques open routes to directly visualize the domain structures associated with these symmetry changes. We have pushed Bragg Coherent Diffractive Imaging (BCDI) into the cryogenic regime where most phase transitions in quantum materials reside. Utilizing BCDI, we image the structural evolution of LBCO microcrystal samples during the high-temperature-tetragonal (HTT) to low-temperature-orthorhombic (LTO) phase transition. Our results show the formation of LTO domains close to the transition temperature and how the domain size varies with temperature. The LTO domain size is shown to decrease with temperature and to be inversely proportional to the magnitude of the orthorhombic distortion. The number of domains follows the secondary order parameter (or orthorhombic strain) measurement with a critical exponent that is consistent with the 3D universality class.

preprint2010arXiv

Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this article we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. The article also discusses the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.