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Huifeng Li

Huifeng Li appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

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Published work

2 published item(s)

preprint2016arXiv

Angle-of-Attack Modulation in Trajectory Tracking for a Reusable Launch Vehicle

This paper deals with the problem of angle-of-attack modulation with the aim of enhancing transient performance of entry guidance during bank reversals, while compensating adverse effects of fast time-varying transient disturbances. An extended single-input/single-output system is developed in the velocity domain by means of a dynamic extension technique, and explicitly captures the trajectory dynamics of angle-of-attack modulation. A normal form for this extended system is derived for the sake of employing a feedback linearization controller. Further, the control characteristics of angle-of-attack modulation is found to be a non-minimum phase behavior under two common conditions in a near- equilibrium glide flight. Therefore, the issue of angle-of-attack modulation is formulated as robust output stabilization of the non-minimum phase system. A disturbance observer-based feedback linearization technique is used to design a robustly dynamical output-feedback controller for angle-of-attack modulation, and an internal-state feedback controller for bank-angle modulation is used to stabilize the unstable internal dynamics. Numerical simulations are conducted to demonstrate that the performance of the proposed method of angle-of-attack modulation is enhanced compared to the existing shuttle method.

preprint2013arXiv

Non-destructive and Rapid Evaluation of CVD Graphene by Dark Field Optical Microscopy

Non-destructive and rapid evaluation of graphene directly on the growth substrate (Cu foils) by dark field (DF) optical microscopy is demonstrated. Without any additional treatment, graphene on Cu foils with various coverages can be quickly identified by DF imaging immediately after chemical vapor deposition growth with contrast comparable to scanning electron microscopy. The improved contrast of DF imaging compared to bright field optical imaging was found to be due to Rayleigh scattering of light by the copper steps beneath graphene. Indeed, graphene adlayers are readily distinguished, due to the different height of copper steps beneath graphene regions of different thickness.