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Gergely Zimanyi

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cond-mat.mtrl-sci cond-mat.mes-hall

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preprint2019arXiv

Commensuration Effects in Layered Nanoparticle Solids

We have developed HiNTS, the {\bf Hi}erarchical {\bf N}anoparticle {\bf T}ransport {\bf S}imulator, and adapted it to study commensuration effects in two classes of Nanoparticle (NP) solids: (1) a bilayer NP solid (BNS) with an energy offset, and (2) a BNS as part of a Field-Effect Transistor (FET). HiNTS integrates the ab initio characterization of single NPs with the phonon-assisted tunneling transition model of the NP-NP transitions into a Kinetic Monte Carlo based simulation of the charge transport in NP solids. First, we studied a BNS with an inter-layer energy offset $Δ$ , possibly caused by a fixed electric field. Our results include the following. (1) In the independent energy-offset model, we observed the emergence of commensuration effects when scanning the electron filling factor $FF$ across integer values. These commensuration effects were profound as they reduced the mobility by several orders of magnitude. We analyzed these commensuration effects in a five dimensional parameter space, as a function of the on-site charging energy $E_C$ , energy offset $Δ$ , the disorder $D$ , the electron filling factor $FF$ , and the temperature $k_{B}T$ . We demonstrated the complexity of our model by showing that at integer filling factors $FF$ commensuration effects are present in some regions of the parameter space, while they vanish in other regions, thus defining distinct dynamical phases of the model. We determined the phase boundaries between these dynamical phases. (2) Using these results as a foundation, we shifted our focus to the experimentally much-studied NP-FETs. NP-FETs are also characterized by an inter-layer energy offset $Δ$ , which, in contrast to our first model, is set by the gate voltage $V_G$ and thereby related to the electron filling $FF$ . We demonstrated the emergence of commensuration effects and distinct dynamical phases in these NP-FETs.

preprint2016arXiv

Grain-size dependent demagnetizing factors in permanent magnets

The coercive field of permanent magnets decreases with increasing grain size. The grain size dependence of coercivity is explained by a size dependent demagnetizing factor. In Dy free Nd $_2$ Fe $_{14}$ B magnets the size dependent demagnetizing factor ranges from 0.2 for a grain size of 55 nm to 1.22 for a grain size of 8300 nm. The comparison of experimental data with micromagnetic simulations suggests that the grain size dependence of the coercive field in hard magnets is due to the non-uniform magnetostatic field in polyhedral grains.

preprint2016arXiv

Influence of defect thickness on the angular dependence of coercivity in rare-earth permanent magnets

The coercive field and angular dependence of the coercive field of single-grain Nd $_{2}$ Fe $_{14}$ B permanent magnets are computed using finite element micromagnetics. It is shown that the thickness of surface defects plays a critical role in determining the reversal process. For small defect thicknesses reversal is heavily driven by nucleation, whereas with increasing defect thickness domain wall de-pinning becomes more important. This change results in an observable shift between two well-known behavioral models. A similar trend is observed in experimental measurements of bulk samples, where a Nd-Cu infiltration process has been used to enhance coercivity by modifying the grain boundaries. When account is taken of the imperfect grain alignment of real magnets, the single-grain computed results appears to closely match experimental behaviour.

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