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Gerald Kothleitner

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2 published item(s)

preprint2021arXiv

Analyzing Nanogranularity of Focused Electron-Beam-Induced Deposited (FEBID) Materials by Electron Tomography

Nanogranular material systems are promising for a variety of applications in research and development. Their physical properties are often determined by grain sizes, shapes, mutual distances and by the chemistry of the embedding matrix With focused electron beam induced deposition arbitrarily shaped nanocomposite materials can be designed, where metallic, nanogranular structures are embedded in a carbonaceous matrix. Using "post-growth" electron beam curing, these materials can be tuned for improved electric transport or mechanical behavior. Such an optimization necessitates a thorough understanding and characterization of the internal changes in chemistry and morphology, which is where conventional projection based imaging techniques fall short. Here, we apply scanning transmission electron tomography to get a comprehensive picture of the distribution and morphology degree of embedded Pt nanograins after initial fabrication, and we demonstrate the impact of electron beam curing, which leads to condensed regions of interconnected metal nanograins.

preprint2021arXiv

Benefits of direct electron detection and PCA for EELS investigation of organic photovoltaics materials

Electron energy-loss spectroscopy (EELS) is a powerful tool for imaging chemical variations at the nanoscale. Here, we investigate a polymer/organic small molecule-blend used as absorber layer in an organic solar cell and employ EELS for distinguishing polymer donor and small molecule acceptor domains in the nanostructured blend based on elemental maps of light elements, such as nitrogen, sulfur or fluorine. Especially for beam sensitive samples, the electron dose needs to be limited, therefore optimized acquisition and data processing strategies are required. We compare data acquired on a post-column energy filter with a direct electron detection camera to data from a conventional CCD camera on the same filter and we investigate the impact of statistical data processing methods (principal components analysis, PCA) on acquired spectra and elemental maps extracted from spectrum images. Our work shows, that the quality of spectra on a direct electron detection camera is far superior to conventional CCD imaging, and thereby allows clear identification of ionization edges and the fine structure of these edges. For the quality of the elemental maps, the application of PCA is essential to allow a clear separation between the donor and acceptor phase in the bulk heterojunction absorber layer of a non-fullerene organic solar cell.