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G. Cataldo

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2 published item(s)

preprint2019arXiv

The Experiment for Cryogenic Large-aperture Intensity Mapping (EXCLAIM)

The EXperiment for Cryogenic Large-Aperture Intensity Mapping (EXCLAIM) is a cryogenic balloon-borne instrument that will survey galaxy and star formation history over cosmological time scales. Rather than identifying individual objects, EXCLAIM will be a pathfinder to demonstrate an intensity mapping approach, which measures the cumulative redshifted line emission. EXCLAIM will operate at 420-540 GHz with a spectral resolution R=512 to measure the integrated CO and [CII] in redshift windows spanning 0 < z < 3.5. CO and [CII] line emissions are key tracers of the gas phases in the interstellar medium involved in star-formation processes. EXCLAIM will shed light on questions such as why the star formation rate declines at z < 2, despite continued clustering of the dark matter. The instrument will employ an array of six superconducting integrated grating-analog spectrometers (micro-spec) coupled to microwave kinetic inductance detectors (MKIDs). Here we present an overview of the EXCLAIM instrument design and status.

preprint2013arXiv

Optical Properties of Iron Silicates in the Infrared to Millimeter as a Function of Temperatures and Wavelength

The Optical Properties of Astronomical Silicates with Infrared Techniques (OPASI-T) program utilizes multiple instruments to provide spectral data over a wide range of temperature and wavelengths. Experimental methods include Vector Network Analyzer (VNA) and Fourier Transform Spectroscopy (FTS) transmission, and reflection/scattering measurements. From this data, we can determine the optical parameters for the index of refraction, \textit{n}, and the absorption coefficient, \textit{k}. The analysis of the laboratory transmittance data for each sample type is based upon different mathematical models, which are applied to each data set according to their degree of coherence. Presented here are results from iron silicate dust grain analogs, in several sample preparations and at temperatures ranging from 5--300 K, across the infrared and millimeter portion of the spectrum (from 2.5--10,000 \mic\ or 4,000--1 \wvn).