BZPEERReading, trust and collaboration for research
Menu

Discover

GraphFollow connections around a paper, topic or saved view.

Workspaces

HomePick up where your research flow left off.InboxHandle requests, replies and notifications from one place.CollectionsCurate reading lists, evidence sets and shareable dossiers.ResearchSee your private provenance graph, trail and imports.CollaborationMove from discovery into focused discussion rooms.PublishDraft, preview and publish full-text research articles.

Network

ExpertsFind specialists worth following or asking for help.CommunitiesJoin research circles organized around shared work.PartnersSee external organizations active around the same topics.

Opportunities

ListingsBrowse roles, calls and collaborations with clearer fit signals.

Account

Log inReturn to your reading and collaboration workspace.Create accountStart saving work, following people and joining teams.
Log inCreate account

Researcher profile

F. Livet

F. Livet contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-sci

Trust snapshot

Quick read

Trust 15 - UnverifiedVerification L1Unclaimed author
3works
0followers
1topics
4close collaborators

Actions

Decide how to stay connected

Follow researcher0

Identity and collaboration

How to connect with this researcher

Claiming links this public author record to a researcher profile and unlocks direct collaboration workflows.

Log in to claim

Direct collaboration

Open a focused conversation when the fit is right

Claim this author entity first to unlock direct invitations.

Research graph

See the researcher in context

Open full explorer

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

3 published item(s)

preprint2020arXiv

High resolution strain measurements in highly disordered materials

The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. This speckle tracking technique measures strain patterns with a accuracy similar to x-ray single crystal measurements but in amorphous or highly disordered materials.

0 citations0 reviewsNo code linkedOpen access
preprint2013arXiv

Combined coherent x-ray micro-diffraction and local mechanical loading on copper nanocrystals

Coherent x-ray micro-diffraction and local mechanical loading can be combined to investigate the mechanical deformation in crystalline nanostructures. Here we present measurements of plastic deformation in a copper crystal of sub-micron size obtained by loading the sample with an Atomic Force Microscopy tip. The appearance of sharp features in the diffraction pattern, while conserving its global shape, is attributed to crystal defects induced by the tip.

0 citations0 reviewsNo code linkedOpen access
preprint2010arXiv

A coherent way to image dislocations

The use of coherent x-ray beams has been greatly developing for the past decades. They are now used by a wide scientific community to study biological materials, phase transitions in crystalline materials, soft matter, magnetism, strained structures, or nano-objects. Different kinds of measurements can be carried out: x-ray photon correlation spectroscopy allowing studying dynamics in soft and hard matter, and coherent diffraction imaging enabling to reconstruct the shape and strain of some objects by using methods such as holography or ptychography. In this article, we show that coherent x-ray diffraction (CXRD) brings a new insight in another scientific field: the detection of single phase defects in bulk materials. Extended phase objects such as dislocations embedded in the bulk are usually probed by electron microscopy or X-ray topography. However, electron microscopy is restricted to thin samples, and x-ray topography is resolution-limited. We show here that CXRD brings much more accurate information about dislocation lines (DLs) in bulk samples and opens a route for a better understanding of the fine structure of the core of bulk dislocations.

0 citations0 reviewsNo code linkedOpen access