Researcher profile

F. Chiodi

F. Chiodi contributes to research discovery and scholarly infrastructure.

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Published work

3 published item(s)

preprint2012arXiv

Geometry-related magnetic interference patterns in long SNS Josephson junctions

We have measured the critical current dependence on the magnetic flux of two long SNS junctions differing by the normal wire geometry. The samples are made by a Au wire connected to W contacts, via Focused Ion Beam assisted deposition. We could tune the magnetic pattern from the monotonic gaussian-like decay of a quasi 1D normal wire to the Fraunhofer-like pattern of a square normal wire. We explain the monotonic limit with a semiclassical 1D model, and we fit both field dependences with numerical simulations of the 2D Usadel equation. Furthermore, we observe both integer and fractional Shapiro steps. The magnetic flux dependence of the integer steps reproduces as expected that of the critical current Ic, while fractional steps decay slower with the flux than Ic.

preprint2010arXiv

Piercing an interface with a brush: collaborative stiffening

The hairs of a painting brush withdrawn from a wetting liquid self-assemble into clumps whose sizes rely on a balance between liquid surface tension and hairs bending rigidity. Here we study the situation of an immersed carpet in an evaporating liquid bath : the free extremities of the hairs are forced to pierce the liquid interface. The compressive capillary force on the tip of flexible hairs leads to buckling and collapse. However we find that the spontaneous association of hairs into stronger bundles may allow them to resist capillary buckling. We explore in detail the different structures obtained and compare them with similar patterns observed in micro-structured surfaces such as carbon nanotubes "forests".

preprint2009arXiv

Evidence for Two Time Scales in Long SNS Junctions

We use microwave excitation to elucidate the dynamics of long superconductor / normal metal / superconductor Josephson junctions. By varying the excitation frequency in the range 10 MHz - 40 GHz, we observe that the critical and retrapping currents, deduced from the dc voltage vs. dc current characteristics of the junction, are set by two different time scales. The critical current increases when the ac frequency is larger than the inverse diffusion time in the normal metal, whereas the retrapping current is strongly modified when the excitation frequency is above the electron-phonon rate in the normal metal. Therefore the critical and retrapping currents are associated with elastic and inelastic scattering, respectively.