Source author record

Eli Doyle

Eli Doyle appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

2works
2topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

2 published item(s)

preprint2026arXiv

The Tianlai-WIYN North Celestial Cap Redshift Survey

We present the results of a small, low redshift spectroscopic survey of galaxies within 3 degrees of the North Celestial Pole (NCP) selected using V-band photometry obtained from the North Celestial Cap Survey (NCCS) (Gorbikov & Brosch 2014). The purpose of the current survey is to create a redshift space template for 21 cm emission from neutral hydrogen with which to correlate radio line intensity observations by the Tianlai dish and cylinder interferometers. A total of 898 redshifts were obtained from the 2102 extended objects in the NCCS with m_V < 19 in the survey area. After accounting for extinction, the survey geometry and selection effects, the number density and clustering pattern of galaxies in the redshift catalog are consistent with other low redshift surveys. We were also able to identify 11 galaxy cluster candidates from this redshift catalog.

preprint2019arXiv

Role of ferroelectric polarization during growth of highly strained ferroelectrics revealed by in-situ x-ray diffraction

Strain engineering of perovskite oxide thin films has proven to be an extremely powerful method for enhancing and inducing ferroelectric behavior. In ferroelectric thin films and superlattices, the polarization is intricately linked to crystal structure, but we show here that it can also play an important role in the growth process, influencing growth rates, relaxation mechanisms, electrical properties and domain structures. We have studied this effect in detail by focusing on the properties of BaTiO$_{3}$ thin films grown on very thin layers of PbTiO$_{3}$ using a combination of x-ray diffraction, piezoforce microscopy, electrical characterization and rapid in-situ x-ray diffraction reciprocal space maps during the growth using synchrotron radiation. Using a simple model we show that the changes in growth are driven by the energy cost for the top material to sustain the polarization imposed upon it by the underlying layer, and these effects may be expected to occur in other multilayer systems where polarization is present during growth. Our research motivates the concept of polarization engineering during the growth process as a new and complementary approach to strain engineering.