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Drew M. Miles

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preprint2022arXiv

High Efficiency Echelle Gratings for the Far Ultraviolet

Modern grating manufacturing techniques suffer from inherent issues that limit their peak efficiencies. The anisotropic etching of silicon facilitates the creation of custom gratings that have sharp and atomically smooth facets, directly addressing these issues. We describe work to fabricate and characterize etched silicon echelles optimized for the far ultraviolet (FUV; 90 - 180 nm) bandpass. We fabricate two echelles that have similar parameters to the mechanically ruled grating flown on the CHESS sounding rocket. We demonstrate a 42% increase in peak order efficiency and an 83% decrease in interorder scatter using these gratings. We also present analysis on where the remaining efficiency resides. These demonstrated FUV echelle improvements benefit the faint source sensitivity and high-resolution performance of future UV observatories.

preprint2020arXiv

Extreme Ultraviolet and Soft X-Ray Diffraction Efficiency of a Blazed Reflection Grating Fabricated by Thermally Activated Selective Topography Equilibration

Future observatories utilizing reflection grating spectrometers for extreme ultraviolet (EUV) and soft X-ray (SXR) spectroscopy require high-fidelity gratings with both blazed groove facets and custom groove layouts that are often fanned or feature a slight curvature. While fabrication procedures centering on wet anisotropic etching in monocrystalline silicon produce highly efficient blazed gratings, the precision of a nonparallel groove layout is limited by the cubic structure of the silicon crystal. This motivates the pursuit of alternative techniques to grating manufacture, namely thermally activated selective topography equilibration (TASTE), which uses gray-scale electron-beam lithography to pattern multilevel structures in resist followed by an optimized polymer thermal reflow to smooth the 3D patterns into continuous surface relief profiles. Using TASTE, a mold for a reflection grating with a periodicity of 400 nm and grooves resembling an asymmetric sawtooth was patterned in 130 nm thick poly(methyl methacrylate) resist on a silicon substrate over a 50 mm by 7.5 mm area. This structure was coated with 15 nm of gold by electron-beam physical vapor deposition using titanium as an adhesion layer and then tested for EUV and SXR diffraction efficiency at beamline 6.3.2 of the Advanced Light Source synchrotron facility. Results demonstrate a quasi-blaze response characteristic of a 27 degree blaze angle with groove facets smooth to 1.5 nm rms. Absolute peak-order efficiency ranges from 75% to 25%, while total relative efficiency measures gap90% across the measured bandpass of 15.5 nm > lambda > 1.55 nm.

preprint2016arXiv

Line Spread Functions of Blazed Off-Plane Gratings Operated in the Littrow Mounting

Future soft X-ray (10 - 50 Angstrom) spectroscopy missions require higher effective areas and resolutions to perform critical science that cannot be done by instruments on current missions. An X-ray grating spectrometer employing off-plane reflection gratings would be capable of meeting these performance criteria. Off-plane gratings with blazed groove facets operated in the Littrow mounting can be used to achieve excellent throughput into orders achieving high resolutions. We have fabricated two off-plane gratings with blazed groove profiles via a technique which uses commonly available microfabrication processes, is easily scaled for mass production, and yields gratings customized for a given mission architecture. Both fabricated gratings were tested in the Littrow mounting at the Max-Planck-Institute for extraterrestrial Physics PANTER X-ray test facility to assess their performance. The line spread functions of diffracted orders were measured, and a maximum resolution of 800 $\pm$ 20 is reported. In addition, we also observe evidence of a `blaze' effect from measurements of relative efficiencies of the diffracted orders.

preprint2015arXiv

Performance Testing of a Novel Off-plane Reflection Grating and Silicon Pore Optic Spectrograph at PANTER

An X-ray spectrograph consisting of radially ruled off-plane reflection gratings and silicon pore optics was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic (SPO) stack used is a test module for the Arcus small explorer mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with a SPO to produce an overlapped spectrum. The gratings were aligned using an active alignment module which allows for the independent manipulation of subsequent gratings to a reference grating in three degrees of freedom using picomotor actuators which are controllable external to the test chamber. We report the line spread functions of the spectrograph and the actively aligned gratings, and plans for future development.