Researcher profile

Dmytro Petryk

Dmytro Petryk contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate

Trust snapshot

Quick read

Trust 17 - UnverifiedVerification L1Unclaimed author
4works
0followers
2topics
4close collaborators

Actions

Decide how to stay connected

Follow researcher0

Identity and collaboration

How to connect with this researcher

Claiming links this public author record to a researcher profile and unlocks direct collaboration workflows.

Log in to claim

Direct collaboration

Open a focused conversation when the fit is right

Claim this author entity first to unlock direct invitations.

Research graph

See the researcher in context

Open full explorer

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

4 published item(s)

preprint2022arXiv

Evaluation of the Sensitivity of RRAM Cells to Optical Fault Injection Attacks

Resistive Random Access Memory (RRAM) is a type of Non-Volatile Memory (NVM). In this paper we investigate the sensitivity of the TiN/Ti/Al:HfO2/TiN-based 1T-1R RRAM cells implemented in a 250 nm CMOS IHP technology to the laser irradiation in detail. Experimental results show the feasibility to influence the state of the cells under laser irradiation, i.e. successful optical Fault Injection. We focus on the selection of the parameters of the laser station and their influence on the success of optical Fault Injections.

preprint2022arXiv

Metal Fillers as Potential Low Cost Countermeasure against Optical Fault Injection Attacks

Physically accessible devices such as sensor nodes in Wireless Sensor Networks or "smart" devices in the Internet of Things have to be resistant to a broad spectrum of physical attacks, for example to Side Channel Analysis and to Fault Injection attacks. In this work we concentrate on the vulnerability of ASICs to precise optical Fault Injection attacks. Here we propose to use metal fillers as potential low-cost countermeasure that may be effective against a broad spectrum of physical attacks. In our future work we plan to evaluate different methods of metal fillers placement, to select an effective one and to integrate it as additional design rules into automated design flows.

preprint2022arXiv

Optical Fault Injection Attacks against Radiation-Hard Registers

If devices are physically accessible optical fault injection attacks pose a great threat since the data processed as well as the operation flow can be manipulated. Successful physical attacks may lead not only to leakage of secret information such as cryptographic private keys, but can also cause economic damage especially if as a result of such a manipulation a critical infrastructure is successfully attacked. Laser based attacks exploit the sensitivity of CMOS technologies to electromagnetic radiation in the visible or the infrared spectrum. It can be expected that radiation-hard designs, specially crafted for space applications, are more robust not only against high-energy particles and short electromagnetic waves but also against optical fault injection attacks. In this work we investigated the sensitivity of radiation-hard JICG shift registers to optical fault injection attacks. In our experiments, we were able to trigger bit-set and bit-reset repeatedly changing the data stored in single JICG flip-flops despite their high-radiation fault tolerance.

preprint2022arXiv

Sensitivity of Standard Library Cells to Optical Fault Injection Attacks in IHP 250 nm Technology

The IoT consists of a lot of devices such as embedded systems, wireless sensor nodes (WSNs), control systems, etc. It is essential for some of these devices to protect information that they process and transmit. The issue is that an adversary may steal these devices to gain a physical access to the device. There is a variety of ways that allows to reveal cryptographic keys. One of them are optical Fault Injection attacks. We performed successful optical Fault Injections into different type of gates, in particular INV, NAND, NOR, FF. In our work we concentrate on the selection of the parameters configured by an attacker and their influence on the success of the Fault Injections.