Researcher profile

David Jimenez

David Jimenez contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate

cond-mat.mes-hall

Trust snapshot

Quick read

Trust 15 - Baseline

3works

0followers

1topics

3close collaborators

Actions

Decide how to stay connected

Follow researcher0

Inspect adjacent work, topics, institutions and collaborators without jumping out to a separate graph page.

Building this graph slice

BZPEER is loading the nearby papers, people, topics and institutions for this page.

preprint2012arXiv

Drift-diffusion model for single layer transition metal dichalcogenide field-effect transistors

A physics-based model for the surface potential and drain current for monolayer transition metal dichalcogenide (TMD) field-effect transistor (FET) is presented. Taking into account the 2D density-of-states of the atomic layer thick TMD and its impact on the quantum capacitance, a model for the surface potential is presented. Next, considering a drift-diffusion mechanism for the carrier transport along the monolayer TMD, an explicit expression for the drain current has been derived. The model has been benchmarked with a measured prototype transistor. Based on the proposed model, the device design window targeting low-power applications is discussed.

preprint2011arXiv

Explicit drain-current model of graphene field-effect transistors targeting analog and radio-frequency applications

We present a compact physics-based model of the current-voltage characteristics of graphene field-effect transistors, of especial interest for analog and radio-frequency applications where bandgap engineering of graphene could be not needed. The physical framework is a field-effect model and drift-diffusion carrier transport. Explicit closed-form expressions have been derived for the drain current covering continuosly all operation regions. The model has been benchmarked with measured prototype devices, demonstrating accuracy and predictive behavior. Finally, we show an example of projection of the intrinsic gain as a figure of merit commonly used in RF /analog applications.

preprint2010arXiv

Analytic model for the surface potential and drain current in negative capacitance field-effect transistors

In 2008, Salahuddin and Datta proposed that a ferroelectric material operating in the negative capacitance region could act as a step-up converter of the surface potential in a MOS structure, opening a new route for the realization of transistors with steeper subthreshold characteristics (S<60 mV/decade). In this letter, a comprehensive physics-based surface potential and drain current model for the negative capacitance field-effect transistor is reported. The model is aimed to evaluate the potentiality of such transistors for low-power switching applications. Moreover it provides a model core for memories devices relying on the hysteretic behavior of the ferroelectric gate insulator.

Institution

Affiliation not imported yet

This author record came from a source that does not expose affiliation metadata. Once the author claims the profile or we enrich the record from another provider, this section will link to the concrete institution.

Topic footprint