Source author record

David Gustafsson

David Gustafsson appears in the imported research catalog. Authorship, coauthor and topic links are available while profile ownership is still unclaimed.

ResearcherUnclaimed source record

Catalog footprint

What is connected

3works
2topics
4close collaborators

Actions

Connect this record

Log in to claim

Research graph

See the researcher in context

Open full explorer

Inspect adjacent papers, topics, institutions and collaborators without losing the researcher page.

Building this map preview

BZPEER is loading the nearby papers, people, topics and institutions for this page.

Published work

3 published item(s)

preprint2026arXiv

Neuromorphic Monocular Depth Estimation with Uncertainty Modeling

Event cameras offer distinct advantages over conventional frame-based sensors, including microsecond-level temporal resolution, high dynamic range, and low bandwidth. In this paper, we predict per-pixel depth distributions from monocular event streams using deep neural networks. We estimate uncertainty using Gaussian, log-normal, and evidential learning frameworks. We compare six event representations: spatio-temporal voxel grids with 1, 5, 10, and 20 temporal bins, the Compact Spatio-Temporal Representation (CSTR), and Time-Ordered Recent Event (TORE) volumes. Our U-Net-based models are trained on synthetic data and then fine-tuned on real sequences. We evaluate performance using absolute relative error, root mean squared error, and the area under the sparsification error. Quantitative results show that the representations perform similarly, while 10 bin log-normal and 5 bin evidential learning perform best across metrics. Our experiments demonstrate that uncertainty estimation can be successfully integrated into event-based monocular depth estimation, and be used to indicate pixels with reliable depth.

preprint2011arXiv

Noise properties of nanoscale YBCO Josephson junctions

We present electric noise measurements of nanoscale biepitaxial YBa2Cu3O(7-x) (YBCO) Josephson junctions fabricated by two different lithographic methods. The first (conventional) technique defines the junctions directly by ion milling etching through an amorphous carbon mask. The second (soft patterning) method makes use of the phase competition between the superconducting YBCO (Y123) and the insulating Y2BaCuO5 (Y211) phase at the grain boundary interface on MgO (110) substrates. The voltage noise properties of the two methods are compared in this study. For all junctions (having a thickness of 100 nm and widths of 250-500 nm) we see a significant amount of individual charge traps. We have extracted an approximate value for the effective area of the charge traps from the noise data. From the noise measurements we infer that the soft patterned junctions with a grain boundary (GB) interface manifesting a large c-axis tunneling component have a uniform barrier and a SIS like behavior. The noise properties of soft patterned junctions having a GB interface dominated by transport parallel to the ab-planes are in accordance with a resonant tunneling barrier model. The conventionally patterned junctions, instead, have suppressed superconducting transport channels with an area much less than the nominal junction area. These findings are important for the implementation of nanosized Josephson junctions in quantum circuits.

preprint2011arXiv

Soft nanostructuring of YBCO Josephson Junctions by phase separation

We have developed a new method to fabricate biepitaxial YBa2Cu3O(7-x) (YBCO) Josephson junctions at the nanoscale, allowing junctions widths down to 100 nm and simultaneously avoiding the typical damage in grain boundary interfaces due to conventional patterning procedures. By using the competition between the superconducting YBCO and the insulating Y2BaCuO5 phases during film growth, we formed nanometer sized grain boundary junctions in the insulating Y2BaCuO5 matrix as confirmed by high resolution transmission electron microscopy. Electrical transport measurements give clear indications that we are close to probing the intrinsic properties of the grain boundaries.