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Clemens Heitzinger

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Published work

3 published item(s)

preprint2020arXiv

A Bayesian estimation method for variational phase-field fracture problems

In this work, we propose a parameter estimation framework for fracture propagation problems. The fracture problem is described by a phase-field method. Parameter estimation is realized with a Bayesian framework. Here, the focus is on uncertainties arising in the solid material parameters and the critical energy release rate. A reference value (obtained on a sufficiently small mesh) as the replacement of measurement will be chosen, and their posterior distribution is obtained. Due to time- and mesh dependency of the problem, the computational costs can be high. Using Bayesian inversion, we solve the problem on a relatively coarse mesh and fit the parameters. The obtained load-displacement curve that is usually the target function is matched with the reference values. Finally, our algorithmic approach is substantiated with several numerical examples.

preprint2020arXiv

An adaptive multilevel Monte Carlo algorithm for the stochastic drift-diffusion-Poisson system

We present an adaptive multilevel Monte Carlo algorithm for solving the stochastic drift-diffusion-Poisson system with non-zero recombination rate. The a-posteriori error is estimated to enable goal-oriented adaptive mesh refinement for the spatial dimensions, while the a-priori error is estimated to guarantee \red{linear} convergence of the $H^1$ error. In the adaptive mesh refinement, efficient estimation of the error indicator gives rise to better error control. For the stochastic dimensions, we use the multilevel Monte Carlo method to solve this system of stochastic partial differential equations. Finally, the advantage of the technique developed here compared to uniform mesh refinement is discussed using a realistic numerical example.

preprint2020arXiv

Frequency dependence of dielectrophoresis fabrication of single-walled carbon nanotube field-effect transistor

In this paper, we present a new theoretical model for the dielectrophoresis (DEP) process of the single-walled carbon nanotubes (SWCNT). We obtain a different frequency interval for the alignment of wide energy gap semiconductor SWCNTs which shows a considerable difference with the prevalent model. For this, we study two specific models namely, the spherical model and the ellipsoid model to estimate the frequency interval. Then, we perform the DEP process and use the obtained frequencies (of spherical and ellipsoid models) for the alignment of the SWCNTs. Our empirical results declare the theoretical prediction, i.e., a crucial step toward the realization of carbon nanotube field-effect transistor (CNT-FET) with the DEP process based on the ellipsoid model.