Researcher profile

Christopher Hoyle

Christopher Hoyle contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2021arXiv

Reliability-based topology optimization under random-field material model

This paper presents an algorithm for reliability-based topology optimization of linear elastic continua under random-field material model. The modelling random field is discretized into a small number of random variables, and then the interested output is estimated by a stochastic response surface. A single-loop inverse-reliability algorithm is applied to reduce computational cost of reliability analysis. Two common benchmark problems in literature are used for demonstration purposes. Different values of target reliability and ranges of Young's modulus are considered to investigate their effects on resulting optimized topologies. Lastly, Monte Carlo simulation tests the proposed algorithm for correctness and accuracy.

preprint2021arXiv

Robust reliability-based topology optimization under random-field material model

This paper proposes an algorithm to find robust reliability-based topology optimized designs under a random-field material model. The initial design domain is made of linear elastic material whose property, i.e., Young's modulus, is modeled by a random field. To facilitate computation, the Karhunen-Loève expansion discretizes the modeling random field into a small number of random variables. Robustness is achieved by optimizing a weighted sum of mean and standard deviation of a quantity of interest, while reliability is employed through a probabilistic constraint. The Smolyak-type sparse grid and the stochastic response surface method are applied to reduce computational cost. Furthermore, an efficient inverse-reliability algorithm is utilized to decouple the double-loop structure of reliability analysis. The proposed algorithm is tested on two common benchmark problems in literature. Finally, Monte Carlo simulation is used to validate the claimed robustness and reliability of optimized designs.