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Researcher profile

Chih-Jen Shih

Chih-Jen Shih contributes to research discovery and scholarly infrastructure.

ResearcherAffiliation not importedOpen to collaborate
cond-mat.mtrl-scicond-mat.mes-hall

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Published work

2 published item(s)

preprint2022arXiv

Solid-State Lifshitz-van der Waals Repulsion through Two-Dimensional Materials

In the 1960s, Lifshitz et al. predicted that quantum fluctuations can change the van der Waals (vdW) interactions from attraction to repulsion. However, the vdW repulsion, or its long-range counterpart - the Casimir repulsion, has only been demonstrated in liquid. Here we show that the atomic thickness and birefringent nature of two-dimensional materials make them a versatile medium to tailor the Lifshitz-vdW interactions. Based on our theoretical prediction, we present direct force measurement of vdW repulsion on 2D material surfaces without liquid immersion and demonstrate their substantial influence on epitaxial properties. For example, heteroepitaxy of gold on a sheet of freestanding graphene leads to the growth of ultrathin platelets, owing to the vdW repulsion-induced ultrafast diffusion of gold clusters. The creation of repulsive force in nanoscale proximity offers technological opportunities such as single-molecule actuation and atomic assembly.

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preprint2019arXiv

Electronic polarizability as the fundamental variable in the dielectric properties of two-dimensional materials

The dielectric constant, which defines the polarization of the media, is a key quantity in condensed matter. It determines several electronic and optoelectronic properties important for a plethora of modern technologies from computer memory to field effect transistors and communication circuits. Moreover, the importance of the dielectric constant in describing electromagnetic interactions through screening plays a critical role in understanding fundamental molecular interactions. Here we show that despite its fundamental transcendence, the dielectric constant does not define unequivocally the dielectric properties of two-dimensional (2D) materials due to the locality of their electrostatic screening. Instead, the electronic polarizability correctly captures the dielectric nature of a 2D material which is united to other physical quantities in an atomically thin layer. We reveal a long-sought universal formalism where electronic, geometrical and dielectric properties are intrinsically correlated through the polarizability opening the door to probe quantities yet not directly measurable including the real covalent thickness of a layer. We unify the concept of dielectric properties in any material dimension finding a global dielectric anisotropy index defining their controllability through dimensionality.

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