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C. Bruderer

C. Bruderer contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2021arXiv

Image feature extraction and galaxy classification: a novel and efficient approach with automated machine learning

In this work we explore the possibility of applying machine learning methods designed for one-dimensional problems to the task of galaxy image classification. The algorithms used for image classification typically rely on multiple costly steps, such as the Point Spread Function (PSF) deconvolution and the training and application of complex Convolutional Neural Networks (CNN) of thousands or even millions of parameters. In our approach, we extract features from the galaxy images by analysing the elliptical isophotes in their light distribution and collect the information in a sequence. The sequences obtained with this method present definite features allowing a direct distinction between galaxy types, as opposed to smooth Sérsic profiles. Then, we train and classify the sequences with machine learning algorithms, designed through the platform Modulos AutoML, and study how they optimize the classification task. As a demonstration of this method, we use the second public release of the Dark Energy Survey (DES DR2). We show that by applying it to this sample we are able to successfully distinguish between early-type and late-type galaxies, for images with signal-to-noise ratio greater then 300. This yields an accuracy of $86\%$ for the early-type galaxies and $93\%$ for the late-type galaxies, which is on par with most contemporary automated image classification approaches. Our novel method allows for galaxy images to be accurately classified and is faster than other approaches. Data dimensionality reduction also implies a significant lowering in computational cost. In the perspective of future data sets obtained with e.g. Euclid and the Vera Rubin Observatory (VRO), this work represents a path towards using a well-tested and widely used platform from industry in efficiently tackling galaxy classification problems at the peta-byte scale.

preprint2019arXiv

Monte Carlo Control Loops for cosmic shear cosmology with DES Year 1

Weak lensing by large-scale structure is a powerful probe of cosmology and of the dark universe. This cosmic shear technique relies on the accurate measurement of the shapes and redshifts of background galaxies and requires precise control of systematic errors. The Monte Carlo Control Loops (MCCL) is a forward modelling method designed to tackle this problem. It relies on the Ultra Fast Image Generator (UFig) to produce simulated images tuned to match the target data statistically, followed by calibrations and tolerance loops. We present the first end-to-end application of this method, on the Dark Energy Survey (DES) Year 1 wide field imaging data. We simultaneously measure the shear power spectrum $C_{\ell}$ and the redshift distribution $n(z)$ of the background galaxy sample. The method includes maps of the systematic sources, Point Spread Function (PSF), an Approximate Bayesian Computation (ABC) inference of the simulation model parameters, a shear calibration scheme, and the fast estimation of the covariance matrix. We find a close statistical agreement between the simulations and the DES Y1 data using an array of diagnostics. In a non-tomographic setting, we derive a set of $C_\ell$ and $n(z)$ curves that encode the cosmic shear measurement, as well as the systematic uncertainty. Following a blinding scheme, we measure the combination of $Ω_m$, $σ_8$, and intrinsic alignment amplitude $A_{\rm{IA}}$, defined as $S_8D_{\rm{IA}} = σ_8(Ω_m/0.3)^{0.5}D_{\rm{IA}}$, where $D_{\rm{IA}}=1-0.11(A_{\rm{IA}}-1)$. We find $S_8D_{\rm{IA}}=0.895^{+0.054}_{-0.039}$, where systematics are at the level of roughly 60\% of the statistical errors. We discuss these results in the context of earlier cosmic shear analyses of the DES Y1 data. Our findings indicate that this method and its fast runtime offer good prospects for cosmic shear measurements with future wide-field surveys.