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Baosheng Wang

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2 published item(s)

preprint2026arXiv

JPU: Bridging Jailbreak Defense and Unlearning via On-Policy Path Rectification

Despite extensive safety alignment, Large Language Models (LLMs) often fail against jailbreak attacks. While machine unlearning has emerged as a promising defense by erasing specific harmful parameters, current methods remain vulnerable to diverse jailbreaks. We first conduct an empirical study and discover that this failure mechanism is caused by jailbreaks primarily activating non-erased parameters in the intermediate layers. Further, by probing the underlying mechanism through which these circumvented parameters reassemble into the prohibited output, we verify the persistent existence of dynamic $\textbf{jailbreak paths}$ and show that the inability to rectify them constitutes the fundamental gap in existing unlearning defenses. To bridge this gap, we propose $\textbf{J}$ailbreak $\textbf{P}$ath $\textbf{U}$nlearning (JPU), which is the first to rectify dynamic jailbreak paths towards safety anchors by dynamically mining on-policy adversarial samples to expose vulnerabilities and identify jailbreak paths. Extensive experiments demonstrate that JPU significantly enhances jailbreak resistance against dynamic attacks while preserving the model's utility.

preprint2007arXiv

A Fast Diagnosis Scheme for Distributed Small Embedded SRAMs

This paper proposes a diagnosis scheme aimed at reducing diagnosis time of distributed small embedded SRAMs (e-SRAMs). This scheme improves the one proposed in [A parallel built-in self-diagnostic method for embedded memory buffers, A parallel built-in self-diagnostic method for embedded memory arrays]. The improvements are mainly two-fold. On one hand, the diagnosis of time-consuming Data Retention Faults (DRFs), which is neglected by the diagnosis architecture in [A parallel built-in self-diagnostic method for embedded memory buffers, A parallel built-in self-diagnostic method for embedded memory arrays], is now considered and performed via a DFT technique referred to as the "No Write Recovery Test Mode (NWRTM)". On the other hand, a pair comprising a Serial to Parallel Converter (SPC) and a Parallel to Serial Converter (PSC) is utilized to replace the bi-directional serial interface, to avoid the problems of serial fault masking and defect rate dependent diagnosis. Results from our evaluations show that the proposed diagnosis scheme achieves an increased diagnosis coverage and reduces diagnosis time compared to those obtained in [A parallel built-in self-diagnostic method for embedded memory buffers, A parallel built-in self-diagnostic method for embedded memory arrays], with neglectable extra area cost.