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Akihisa Tomita

Akihisa Tomita contributes to research discovery and scholarly infrastructure.

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Published work

2 published item(s)

preprint2019arXiv

Operational formulation of weak values without probe systems

Weak values are the fundamental values for observables in a pre- and post-selected system. Weak values are typically measured by weak measurement, in which weak values appear in the change of not the pre- and post-selected system but the probe system. This indirect characteristic of weak measurement obscures the meaning of weak values for the pre- and post-selected system, in contrast to conventional physical quantities, which have a clear operational meaning. In this study, we operationally formulate weak values as the sensitivity of post-selection probability amplitude to small transformation in a pre- and post-selected system. This formulation of weak values, which is free from the concept of probe shift assumed in weak measurement, gives a direct interpretation of strange weak values for the pre- and post-selected system. We further explain that this formulation can simplify weak-value measurement experiments because no probe system is required.

preprint2018arXiv

A framework for measuring weak values without weak interactions and its diagrammatic representation

Weak values are typically obtained experimentally by performing weak measurements, which involve weak interactions between the measured system and a probe. However, the determination of weak values does not necessarily require weak measurements, and several methods without weak system-probe interactions have been developed previously. In this work, a framework for measuring weak values is proposed to describe the relationship between various weak measurement techniques in a unified manner. This framework, which uses a probe-controlled system transformation instead of the weak system-probe interaction, improves the understanding of the currently used weak value measurement methods. Furthermore, a diagrammatic representation of the proposed framework is introduced to intuitively identify the complex values obtained in each measurement system. By using this diagram, a new method for measuring weak values with a desired function can be systematically derived. As an example, a scan-free and more efficient direct measurement method of wavefunctions than the conventional techniques using weak measurements is developed.