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A. Stibor

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Published work

2 published item(s)

preprint2009arXiv

Integrated Atom Detector Based on Field Ionization near Carbon Nanotubes

We demonstrate an atom detector based on field ionization and subsequent ion counting. We make use of field enhancement near tips of carbon nanotubes to reach extreme electrostatic field values of up to 9x10^9 V/m, which ionize ground state rubidium atoms. The detector is based on a carpet of multiwall carbon nanotubes grown on a substrate and used for field ionization, and a channel electron multiplier used for ion counting. We measure the field enhancement at the tips of carbon nanotubes by field emission of electrons. We demonstrate the operation of the field ionization detector by counting atoms from a thermal beam of a rubidium dispenser source. By measuring the ionization rate of rubidium as a function of the applied detector voltage we identify the field ionization distance, which is below a few tens of nanometers in front of nanotube tips. We deduce from the experimental data that field ionization of rubidium near nanotube tips takes place on a time scale faster than 10^(-10)s. This property is particularly interesting for the development of fast atom detectors suitable for measuring correlations in ultracold quantum gases. We also describe an application of the detector as partial pressure gauge.

preprint2007arXiv

Calibration of a single atom detector for atomic micro chips

We experimentally investigate a scheme for detecting single atoms magnetically trapped on an atom chip. The detector is based on the photoionization of atoms and the subsequent detection of the generated ions. We describe the characterization of the ion detector with emphasis on its calibration via the correlation of ions with simultaneously generated electrons. A detection efficiency of 47.8% (+-2.6%) is measured, which is useful for single atom detection, and close to the limit allowing atom counting with sub-Poissonian uncertainty.