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A. Giray Yağlıkçı

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2 published item(s)

preprint2022arXiv

DR-STRaNGe: End-to-End System Design for DRAM-based True Random Number Generators

Random number generation is an important task in a wide variety of critical applications including cryptographic algorithms, scientific simulations, and industrial testing tools. True Random Number Generators (TRNGs) produce truly random data by sampling a physical entropy source that typically requires custom hardware and suffers from long latency. To enable high-bandwidth and low-latency TRNGs on commodity devices, recent works propose TRNGs that use DRAM as an entropy source. Although prior works demonstrate promising DRAM-based TRNGs, integration of such mechanisms into real systems poses challenges. We identify three challenges for using DRAM-based TRNGs in current systems: (1) generating random numbers can degrade system performance by slowing down concurrently-running applications due to the interference between RNG and regular memory operations in the memory controller (i.e., RNG interference), (2) this RNG interference can degrade system fairness by unfairly prioritizing applications that intensively use random numbers (i.e., RNG applications), and (3) RNG applications can experience significant slowdowns due to the high RNG latency. We propose DR-STRaNGe, an end-to-end system design for DRAM-based TRNGs that (1) reduces the RNG interference by separating RNG requests from regular requests in the memory controller, (2) improves the system fairness with an RNG-aware memory request scheduler, and (3) hides the large TRNG latencies using a random number buffering mechanism with a new DRAM idleness predictor that accurately identifies idle DRAM periods. We evaluate DR-STRaNGe using a set of 186 multiprogrammed workloads. Compared to an RNG-oblivious baseline system, DR-STRaNGe improves the average performance of non-RNG and RNG applications by 17.9% and 25.1%, respectively. DR-STRaNGe improves average system fairness by 32.1% and reduces average energy consumption by 21%.

preprint2022arXiv

Understanding RowHammer Under Reduced Wordline Voltage: An Experimental Study Using Real DRAM Devices

RowHammer is a circuit-level DRAM vulnerability, where repeatedly activating and precharging a DRAM row, and thus alternating the voltage of a row's wordline between low and high voltage levels, can cause bit flips in physically nearby rows. Recent DRAM chips are more vulnerable to RowHammer: with technology node scaling, the minimum number of activate-precharge cycles to induce a RowHammer bit flip reduces and the RowHammer bit error rate increases. Therefore, it is critical to develop effective and scalable approaches to protect modern DRAM systems against RowHammer. To enable such solutions, it is essential to develop a deeper understanding of the RowHammer vulnerability of modern DRAM chips. However, even though the voltage toggling on a wordline is a key determinant of RowHammer vulnerability, no prior work experimentally demonstrates the effect of wordline voltage (VPP) on the RowHammer vulnerability. Our work closes this gap in understanding. This is the first work to experimentally demonstrate on 272 real DRAM chips that lowering VPP reduces a DRAM chip's RowHammer vulnerability. We show that lowering VPP 1) increases the number of activate-precharge cycles needed to induce a RowHammer bit flip by up to 85.8% with an average of 7.4% across all tested chips and 2) decreases the RowHammer bit error rate by up to 66.9% with an average of 15.2% across all tested chips. At the same time, reducing VPP marginally worsens a DRAM cell's access latency, charge restoration, and data retention time within the guardbands of system-level nominal timing parameters for 208 out of 272 tested chips. We conclude that reducing VPP is a promising strategy for reducing a DRAM chip's RowHammer vulnerability without requiring modifications to DRAM chips.